Chennai, India

Rahul Lakhawat

USPTO Granted Patents = 3 

 

Average Co-Inventor Count = 7.5

ph-index = 2

Forward Citations = 12(Granted Patents)


Location History:

  • Chennai, IN (2016 - 2018)
  • Tamil Nadu, IN (2021)

Company Filing History:


Years Active: 2016-2021

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3 patents (USPTO):Explore Patents

Title: Innovator Profile: Rahul Lakhawat from Chennai, India

Introduction: Rahul Lakhawat is an accomplished inventor based in Chennai, India, known for his innovative contributions to the field of semiconductor inspection technology. With a keen focus on improving defect detection methods, he has been awarded two patents that significantly enhance the capabilities of inspection systems.

Latest Patents:

1. **Sub-pixel Alignment of Inspection to Design** - This patent describes methods and systems for accurately aligning the output generated by an inspection subsystem to the design data space of a specimen. It addresses the challenges posed by design deformation during inspections and proposes solutions for generating alignment targets that can be shared across multiple specimens, ensuring consistent performance across similar layers and design rules.

2. **Wafer Defect Discovery** - This patent details a systematic approach for discovering defects on a wafer. The method involves applying a threshold to output generated by a detector during the initial scan and determining feature values for detected defects. It includes the ranking of features, identifying feature cut-lines to classify defects into bins, and determining parameters that will create a defect population with a predefined count and diversified feature values upon another scan.

Career Highlights: Rahul is presently employed at Kla Tencor Corporation, where he applies his expertise in semiconductor technologies to drive innovation within the company. His work focuses on enhancing inspection techniques that are critical for quality assurance in semiconductor manufacturing.

Collaborations: Throughout his career, Rahul has collaborated with notable professionals in the field such as Hong Chen and Kenong Wu. His teamwork with skilled individuals has contributed to successful patent developments and advancements in inspection methodologies.

Conclusion: Rahul Lakhawat's contributions to semiconductor inspection technology through his patents and collaborative efforts showcase his commitment to innovation. His work at Kla Tencor Corporation not only uplifts the company’s technological prowess but also sets a benchmark in the industry for quality and precision.

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