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For the Inventor, By the Inventor

Austin, TX, United States of America

Qingsu Wang

USPTO Granted Patents = 14

Average Co-Inventor Count = 3.2

ph-index = 9

Forward Citations = 503(Granted Patents)


Location History:

  • Travis, TX (US) (1999)
  • Austin, TX (US) (1998 - 2005)

Company Filing History:

goldMedal14 out of 12,867 
 
Advanced Micro Devices Corporation
 patents

Years Active: 1998-2005

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14 patents (USPTO):Explore Patents
1. 6968303 - Automated system for extracting and combining tool trace data and wafer electrical test (WET) data for semiconductor processing (2005-11-22),
2. 6738731 - Method and apparatus for using tool state information to identify faulty wafers (2004-05-18),
3. 6725402 - Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework (2004-04-20),
4. 6697691 - Method and apparatus for fault model analysis in manufacturing tools (2004-02-24),
5. 6629012 - Wafer-less qualification of a processing tool (2003-09-30),
6. 6556959 - Method and apparatus for updating a manufacturing model based upon fault data relating to processing of semiconductor wafers (2003-04-29),
7. 6556882 - Method and apparatus for generating real-time data from static files (2003-04-29),
8. 6546508 - Method and apparatus for fault detection of a processing tool in an advanced process control (APC) framework (2003-04-08),
9. 6532555 - Method and apparatus for integration of real-time tool data and in-line metrology for fault detection in an advanced process control (APC) framework (2003-03-11),
10. 6324341 - Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization (2001-11-27),
11. 6268270 - Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization (2001-07-31),
12. 5914879 - System and method for calculating cluster tool performance metrics using (1999-06-22),
13. 5859964 - System and method for performing real time data acquisition, process (1999-01-12),
14. 5740429 - E10 reporting tool (1998-04-14),

Title: Qingsu Wang: Innovator in Semiconductor Processing

Introduction

Qingsu Wang is a prominent inventor based in Austin, TX, known for his significant contributions to semiconductor processing. With a total of 14 patents to his name, he has made remarkable advancements in the field, particularly in the automation and efficiency of manufacturing processes.

Latest Patents

Wang's latest patents include an automated system for extracting and combining tool trace data and wafer electrical test (WET) data for semiconductor processing. This innovative method configures a final data set for modeling a manufacturing process by integrating real-time and historical data sets. Another notable patent is a method and apparatus for using tool state information to identify faulty wafers. This method involves processing a set of wafers, collecting tool state information, and designating suspect wafers based on outlying tool state information.

Career Highlights

Qingsu Wang is currently employed at Advanced Micro Devices Corporation, where he continues to push the boundaries of semiconductor technology. His work has been instrumental in enhancing the reliability and efficiency of semiconductor manufacturing processes.

Collaborations

Wang collaborates with talented professionals in his field, including coworkers Terrence J Riley and Michael Lee Miller. Their combined expertise contributes to the innovative projects at Advanced Micro Devices Corporation.

Conclusion

Qingsu Wang's contributions to semiconductor processing through his patents and work at Advanced Micro Devices Corporation highlight his role as a leading inventor in the industry. His innovative methods are paving the way for advancements in manufacturing efficiency and reliability.

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