The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2003
Filed:
Jul. 12, 1999
Applicant:
Inventors:
Michael L. Miller, Cedar Park, TX (US);
Qingsu Wang, Austin, TX (US);
Assignee:
Advanced Micro Devices, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G06F 1/710 ; G06F 1/750 ; G06G 7/48 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G06F 1/710 ; G06F 1/750 ; G06G 7/48 ;
Abstract
The present invention provides a method and apparatus for performing automated development and updating of a manufacturing model for a manufacturing process. An initial manufacturing model is developed. Tolerances of the manufacturing model are expanded using additional production data. The manufacturing model is then re-developed using the expanded tolerances.
Miller, Michael. (2003). Method and apparatus for updating a manufacturing model based upon fault data relating to processing of semiconductor wafers (U.S. Patent No. 6556959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6556959
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile