This inventor holds 2 USPTO granted patents. Top assignee: Tokyo Electron Limited. Active years: 2008-2009.
Company Filing History:
Years Active: 2008-2009
Title: Pranav Sheth: Innovator in Optical Metrology
Introduction
Pranav Sheth is a notable inventor based in San Jose, California. He has made significant contributions to the field of optical metrology, particularly in the area of wafer structure profile determination. With a total of 2 patents, his work has advanced the capabilities of optical measurement systems.
Latest Patents
Pranav's latest patents include "Parallel profile determination in optical metrology" and "Parallel profile determination for an optical metrology system." The first patent focuses on processing requests for wafer structure profile determination by utilizing a plurality of measured diffraction signals. This innovative approach involves distributing these signals to multiple instances of a profile search module, which are activated in parallel across various processing threads. This method enhances the efficiency of determining profiles for multiple structures.
The second patent describes a comprehensive system designed to process wafer structure profile determinations. It includes a diffraction signal processor, a diffraction signal distributor, and several profile search servers. The system is configured to obtain and distribute measured diffraction signals, allowing for parallel processing to determine the profiles of various structures.
Career Highlights
Pranav Sheth is currently employed at Tokyo Electron Limited, where he continues to develop cutting-edge technologies in optical metrology. His work has been instrumental in improving the accuracy and speed of optical measurements in semiconductor manufacturing.
Collaborations
Pranav has collaborated with notable colleagues such as Jeffrey Alexander Chard and Hong Qiu. These partnerships have fostered innovation and contributed to the advancement of their shared field.
Conclusion
Pranav Sheth's contributions to optical metrology through his patents and work at Tokyo Electron Limited highlight his role as a key innovator in the industry. His advancements in parallel processing for wafer structure profile determination are paving the way for more efficient optical measurement systems.