This inventor holds 9 USPTO granted patents. Top assignees: Texas Instruments Corporation, Anora, LLC, Georgia Tech Research Corporation. Active years: 2003-2024.
Location History:
- Richardson, TX (US) (2003)
- Plano, TX (US) (2003 - 2024)
Company Filing History:
4 out of 29,854 
3 out of 3 
2 out of 2,187 
Years Active: 2003-2024
Title: Innovations of Pramodchandran Variyam
Introduction
Pramodchandran Variyam is a notable inventor based in Plano, TX, with a remarkable portfolio of nine patents. His work primarily focuses on advancements in semiconductor technology and printed circuit board testing.
Latest Patents
Among his latest innovations is a functional test head for printed circuit boards. This apparatus features a test head frame and a tray that can slide to receive a printed circuit board (PCB) for testing. The PCB is positioned within the frame when the tray is retracted and outside the frame when the tray is ejected. A bed of nails (BON) opposes the lower side of the PCB, with pins arranged to connect with corresponding electrical pads on the PCB when in the retracted position. Additionally, he has developed a voltage spike detector and system for detecting voltage spikes in semiconductor devices. This technology involves detecting voltage spikes based on a comparison of an analog signal and a voltage threshold, converting the signal to a digital format, and generating a stretched pulse for better analysis.
Career Highlights
Pramodchandran has worked with prominent companies such as Texas Instruments Corporation and Anora, LLC. His contributions in these organizations have significantly impacted the field of electronics and semiconductor technology.
Collaborations
He has collaborated with notable coworkers, including Hari Balachandran and Ram Voorakaranam, enhancing the innovation process through teamwork and shared expertise.
Conclusion
Pramodchandran Variyam's contributions to technology through his patents and collaborations highlight his role as a significant inventor in the field of electronics. His work continues to influence advancements in semiconductor devices and testing methodologies.