The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Jun. 28, 2019
Applicant:

Anora, Llc, Richardson, TX (US);

Inventors:

Pramodchandran Variyam, Plano, TX (US);

Sasikumar P. Cherubal, Frisco, TX (US);

Assignee:

Anora, LLC, Richardson, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 31/319 (2006.01); H03M 1/12 (2006.01); G01R 19/10 (2006.01); G01R 31/3193 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2607 (2013.01); G01R 19/10 (2013.01); G01R 31/31922 (2013.01); G01R 31/31932 (2013.01); H03M 1/12 (2013.01);
Abstract

Technologies and methods for detecting voltage spikes on a semiconductor device include detecting a voltage spike in a first analog signal from a semiconductor device based on a comparison of the first analog signal and a first voltage threshold, and converting the first analog signal to a digital signal with a first pulse representing the voltage spike, and transforming the first pulse to a stretched pulse defining a greater width than the first pulse. More specific embodiments include receiving a second analog signal from a first pin on the semiconductor device during a capture time period, receiving a reference analog signal from a reference pin on the semiconductor device during the capture time period, and prior to detecting the voltage spike, generating the first analog signal by computing a difference between the second analog signal and the reference analog signal.


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