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For the Inventor, By the Inventor

Clifton Park, NY, United States of America

Paulo Ricardo Dos Santos Mendonca

This inventor holds 14 USPTO granted patents and 1 EPO patent, primarily in Image Processing. Top assignee: General Electric Company. Active years: 2008-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paulo Ricardo Dos Santos Mendonca. Retrieved from https://idiyas.com/inventor/paulo-ricardo-dos-santos-mendonca

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 14

% Patents Active = 100.0


Average Co-Inventor Count = 4.3

ph-index = 4

Forward Citations = 93(Granted Patents)


Location History:

  • Niskayuna, NY (US) (2017)
  • Clifton Park, NY (US) (2008 - 2019)

Company Filing History:

goldMedal14 out of 52,404 
 
General Electric Company
 patents

Years Active: 2008-2019

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Areas of Expertise:
Defect Detection
Image Processing
Tomographic Reconstruction
Tissue Quantification
Prognostics Automation
Object Measurement
3D Shape Filtering
Anatomical Analysis
Signal Color Detection
Pixel Variance Calculation
Disease Detection
Post-Processing
14 patents (USPTO):Explore Patents
1. 10481108 - System for defect indication detection (2019-11-19),
2. 10203290 - Method for defect indication detection (2019-02-12),
3. 9727671 - Method, system, and program storage device for automating prognostics for physical assets (2017-08-08),
4. 9091528 - System and method for object measurement (2015-07-28),
5. 8942465 - Methods and systems for processing images for inspection of an object (2015-01-27),
6. 8855385 - Apparatus and method for multi-energy tissue quantification (2014-10-07),
7. 8805037 - Method and system for reconstruction of tomographic images (2014-08-12),
8. 8396329 - System and method for object measurement (2013-03-12),
9. 8233662 - Method and system for detecting signal color from a moving video platform (2012-07-31),
10. 8111889 - Method and apparatus for efficient calculation and use of reconstructed pixel variance in tomography images (2012-02-07),
11. 8059900 - Method and apparatus to facilitate visualization and detection of anatomical shapes using post-processing of 3D shape filtering (2011-11-15),
12. 8050734 - Method and system for performing patient specific analysis of disease relevant changes of a disease in an anatomical structure (2011-11-01),
13. 7433086 - Edge detection and correcting system and method (2008-10-07),
14. 7346203 - Methods and apparatus for processing image data to aid in detecting disease (2008-03-18),

Certainly! Here is the article about inventor Paulo Ricardo dos Santos Mendonca:

Title: Innovator Spotlight: Paulo Ricardo dos Santos Mendonca

Introduction: Meet Paulo Ricardo dos Santos Mendonca, a prolific inventor based in Clifton Park, NY, with a remarkable portfolio of 12 patents to his name.

Latest Patents:

1. System for defect indication detection - Paulo's innovative methods, apparatus, and computer-readable media enable the automatic detection of potential defects in parts. This technology empowers operators to efficiently review defects and take necessary actions.

2. Method for defect indication detection - Paulo's cutting-edge approach further enhances the detection of potential defects in parts, providing valuable insights for operators to address issues promptly.

Career Highlights: Paulo is associated with the renowned General Electric Company, where his inventive spirit and dedication have led to groundbreaking solutions in defect detection and beyond.

Collaborations: In his collaborative journey, Paulo has worked closely with talented individuals such as James Vradenburg Miller and Rahul Bhotika, synergizing their expertise to drive innovation forward.

Conclusion: Paulo Ricardo dos Santos Mendonca's contributions to the field of defect indication detection exemplify his commitment to technological advancement and problem-solving. His collaborative efforts and inventive mindset continue to inspire and shape the future of innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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