The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Mar. 31, 2004
Samit Kumar Basu, Niskayuna, NY (US);
Bruno Kristiaan Bernard DE Man, Clifton Park, NY (US);
Peter Michael Edic, Albany, NY (US);
Ricardo Scott Avila, Clifton Park, NY (US);
James Vradenburg Miller, Clifton Park, NY (US);
Colin Craig Mcculloch, Ballston Lake, NY (US);
Deborah Joy Walter, Burnt Hills, NY (US);
Paulo Ricardo Dos Santos Mendonca, Clifton Park, NY (US);
William Macomber Leue, Albany, NY (US);
Thomas Baby Sebastian, Flemington, NJ (US);
Samit Kumar Basu, Niskayuna, NY (US);
Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);
Peter Michael Edic, Albany, NY (US);
Ricardo Scott Avila, Clifton Park, NY (US);
James Vradenburg Miller, Clifton Park, NY (US);
Colin Craig McCulloch, Ballston Lake, NY (US);
Deborah Joy Walter, Burnt Hills, NY (US);
Paulo Ricardo dos Santos Mendonca, Clifton Park, NY (US);
William Macomber Leue, Albany, NY (US);
Thomas Baby Sebastian, Flemington, NJ (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A technique is disclosed for generating variance data and a variance map from measured projection data acquired from a tomography system. The method comprises accessing the measured projection data from the tomography system. The method further comprises generating the variance map from the measured projection data and displaying, analyzing or processing the variance map. The variance data is determined based upon a statistical model from measured image data, and may be used for image analysis, data acquisition, in computer aided diagnosis routines, and so forth.