The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2008

Filed:

Sep. 27, 2004
Applicants:

James Vradenburg Miller, Clifton Park, NY (US);

Paulo Ricardo Dos Santos Mendonca, Clifton Park, NY (US);

Matthew William Turek, Ballston Lake, NY (US);

Dirk Ryan Padfield, Albany, NY (US);

Inventors:

James Vradenburg Miller, Clifton Park, NY (US);

Paulo Ricardo Dos Santos Mendonca, Clifton Park, NY (US);

Matthew William Turek, Ballston Lake, NY (US);

Dirk Ryan Padfield, Albany, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging system for correcting a bias in the location edges in an image is provided. The imaging system comprises an image processor configured to detect edges in an image of a given substructure, characterize a blurring factor in the image and correct a bias in the detected edges in the of a given substructure using the blurring factor.


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