The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jul. 06, 2012
Applicants:

Andras Kriston, Mako, HU;

Peter Alexander John Lamb, Clifton Park, NY (US);

Paulo Ricardo Dos Santos Mendonca, Clifton Park, NY (US);

Masayuki Kudo, Kanagawa, JP;

Kosuke Sasaki, Tokyo, JP;

Souma Sengupta, Cupertino, CA (US);

Rahul Bhotika, Niskayuna, NY (US);

Laszlo Rusko, Szeged, HU;

Bipul Das, Bangalore, IN;

Scott David Wollenweber, Waukesha, WI (US);

Ferenc Kovacs, Kecskemet, HU;

Inventors:

Andras Kriston, Mako, HU;

Peter Alexander John Lamb, Clifton Park, NY (US);

Paulo Ricardo dos Santos Mendonca, Clifton Park, NY (US);

Masayuki Kudo, Kanagawa, JP;

Kosuke Sasaki, Tokyo, JP;

Souma Sengupta, Cupertino, CA (US);

Rahul Bhotika, Niskayuna, NY (US);

Laszlo Rusko, Szeged, HU;

Bipul Das, Bangalore, IN;

Scott David Wollenweber, Waukesha, WI (US);

Ferenc Kovacs, Kecskemet, HU;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for multi-energy tissue quantification includes an x-ray imaging system comprises an x-ray source configured to emit a beam of x-rays toward an object to be imaged, a detector configured to receive the x-rays attenuated by the object, and a data acquisition system (DAS) operably coupled to the detector. A computer operably connected to the x-ray source and the DAS is programmed to cause the x-ray source to emit x-rays at each of a first kVp and a second kVp toward the detector, acquire x-ray data from x-rays emitted at the first and second kVp through a region of interest (ROI), and perform a first multi-material decomposition based on the acquired x-ray data. The computer is also programmed to quantify a volume fraction of a first material in the ROI based on the first multi-material decomposition and display the volume fraction of the first material to a user.


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