Hurley, NY, United States of America

Paul L Wiltgen


Average Co-Inventor Count = 4.1

ph-index = 5

Forward Citations = 352(Granted Patents)


Location History:

  • Hurley, NY (US) (1993 - 1997)
  • Kasson, MN (US) (2000 - 2004)

Company Filing History:


Years Active: 1993-2004

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5 patents (USPTO):Explore Patents

Title: Paul L Wiltgen: Innovator in Integrated Circuit Technology

Introduction

Paul L Wiltgen is a notable inventor based in Hurley, NY (US). He has made significant contributions to the field of integrated circuit technology, holding a total of 5 patents. His work focuses on enhancing manufacturing test interfaces and improving data processing systems.

Latest Patents

Among his latest patents is a method and apparatus for connecting a manufacturing test interface to a global serial bus, including an I2C bus. This innovation provides a robust solution for buffering data transfer to and from the global serial bus. It features input/output buffer logic that facilitates data exchange, along with error detection logic to identify any error conditions. Another significant patent involves a multi-core chip that provides external core access while maintaining regular operation. This design allows for external data transfer through a service access port, enabling multiple service operations without disrupting the device's normal functionality.

Career Highlights

Paul L Wiltgen is currently employed at International Business Machines Corporation (IBM), where he continues to develop cutting-edge technologies. His expertise in integrated circuits and data processing systems has positioned him as a key player in the industry.

Collaborations

Throughout his career, Paul has collaborated with notable colleagues, including Guy Richard Currier and Sharon Denos Vincent. These partnerships have contributed to the advancement of innovative solutions in the field.

Conclusion

Paul L Wiltgen's contributions to integrated circuit technology and his innovative patents reflect his dedication to advancing the industry. His work continues to influence the development of efficient data processing systems and manufacturing test interfaces.

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