The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2004

Filed:

Feb. 18, 1999
Applicant:
Inventors:

Guy Richard Currier, Rochester, MN (US);

James Scott Harveland, Rochester, MN (US);

Sharon Denos Vincent, Rochester, MN (US);

Paul Leonard Wiltgen, Kasson, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract

Methods and apparatus are provided for connecting a manufacturing test interface to a global serial bus, such as an inter integrated circuit (I C) bus. Input/output buffer logic buffers data to be transferred to and from the global serial bus. A slave interface logic connected to the input/output buffer logic receives and sends data to the input/output buffer logic. A slave controller coupled to the input/output buffer logic and the slave interface logic paces data exchange to the input/output buffer logic. Error detection logic is coupled between the input/output buffer and the global serial bus for detecting error conditions.


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