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For the Inventor, By the Inventor

Lake Oswego, OR, United States of America

Paul L Pfaff

This inventor holds 19 USPTO granted patents and 2 published patent applications. Top assignees: Attofemto, Inc., Other. Active years: 2003-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Paul L Pfaff. Retrieved from https://idiyas.com/inventor/paul-l-pfaff

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 19 

% Patents Active = 31.6

Average Co-Inventor Count = 1.2

ph-index = 10

Forward Citations = 332(Granted Patents)


Location History:

  • Portland, OR (US) (2003 - 2007)
  • Lake Oswego, OR (US) (2008 - 2018)

Company Filing History:

goldMedal16 out of 16 
 
Attofemto, Inc.
 patents
silverMedal3 out of 834,513 
Other
 patents

Years Active: 2003-2018

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19 patents (USPTO):Explore Patents
1. 9952161 - Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials (2018-04-24),
2. 9366719 - Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices (2016-06-14),
3. 9250064 - Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices (2016-02-02),
4. 8879071 - Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture (2014-11-04),
5. 8736823 - Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials (2014-05-27),
6. 8462350 - Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture (2013-06-11),
7. 8405823 - Optical to optical infrared imaging detection system (2013-03-26),
8. 8139228 - Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials (2012-03-20),
9. 8040521 - Holographic condition assessment system for a structure including a semiconductor material (2011-10-18),
10. 7773230 - Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material (2010-08-10),
11. 7733499 - Method for optically testing semiconductor devices (2010-06-08),
12. 7728958 - Condition assessment method for a structure including a semiconductor material (2010-06-01),
13. 7420687 - Condition assessment system for a structure including a semiconductor material (2008-09-02),
14. 7400411 - Method for optically testing semiconductor devices (2008-07-15),
15. 7323889 - Voltage testing and measurement (2008-01-29),

Title: Innovations and Contributions of Paul L Pfaff

Introduction

Paul L Pfaff, based in Lake Oswego, Oregon, is a notable inventor with an impressive portfolio of 19 patents. His groundbreaking work primarily focuses on enhancing testing methodologies for semiconductor and anisotropic devices, enabling significant advancements in the field of microelectronics.

Latest Patents

Among his latest patents, Pfaff has developed innovative methods for obtaining and analyzing digital interferometric data, which plays a crucial role in computer testing and the development of semiconductor and anisotropic devices and materials. This interferometric holographic instrument facilitates the generation of digital data for both 2-dimensional and 3-dimensional analysis of real-time semiconductor devices, optimizing testing and development processes.

Additionally, Pfaff has also contributed to the optical to optical methods aimed at enhancing the sensitivity and resolution of ultraviolet, electron beam, and ion beam devices. These enhancements allow for improved spatial and time resolution, vital for quality control during every stage of integrated circuit (IC) manufacturing.

Career Highlights

Throughout his career, Paul L Pfaff has worked with multiple organizations, including Attofemto, Inc., where he honed his expertise in advanced semiconductor technologies. His efforts have not only contributed to his extensive patent portfolio but also to the evolution of testing standards in semiconductor manufacturing.

Collaborations

Collaboration has been key to Pfaff's success. He has worked alongside notable colleagues, including Kevin L Russell and Michael Mauck, collectively advancing the frontiers of semiconductor technology and improving measurement techniques in microelectronics.

Conclusion

Paul L Pfaff's contributions to the field of semiconductor technology are significant, marked by his innovative patents and collaborative spirit. His work continues to influence the way devices are tested and developed, ensuring higher standards in quality control and performance evaluation in the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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