% Expired Patents = 81.3

Forward Citations = 214

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3 inventors (with patents filed for the assignee):

Paul L Pfaff (16 out of 19 patents)

Michael Mauck (1 out of 7 patents)

Kevin L Russell (1 out of 7 patents)

16 patents: Sort by Forward Citations

1. 9952161 - Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials (2018-04-24),

2. 9366719 - Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices (2016-06-14),

3. 9250064 - Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices (2016-02-02),

4. 8879071 - Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture (2014-11-04),

5. 8736823 - Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials (2014-05-27),

6. 8462350 - Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture (2013-06-11),

7. 8405823 - Optical to optical infrared imaging detection system (2013-03-26),

8. 8139228 - Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials (2012-03-20),

9. 8040521 - Holographic condition assessment system for a structure including a semiconductor material (2011-10-18),

10. 7773230 - Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material (2010-08-10),

11. 7733499 - Method for optically testing semiconductor devices (2010-06-08),

12. 7728958 - Condition assessment method for a structure including a semiconductor material (2010-06-01),

13. 7420687 - Condition assessment system for a structure including a semiconductor material (2008-09-02),

14. 7400411 - Method for optically testing semiconductor devices (2008-07-15),

15. 7323889 - Voltage testing and measurement (2008-01-29),

Company Overview

Attofemto, Inc. is a technology company based in Lake Oswego, Oregon, specializing in advanced photonics and ultrafast laser systems. The organization focuses on developing innovative solutions for precision measurement and control in various scientific and industrial applications. By leveraging cutting-edge research in laser technology, Attofemto aims to enhance capabilities in fields such as telecommunications, medical diagnostics, and materials science, contributing to advancements in both academic and commercial sectors.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

16 Patents

#2 in Lake Oswego, OR

#199 in Oregon

#19,922 in US

#37,831 in the World

Lake Oswego, OR, United States of America

Attofemto, Inc.

Forward Citations = 214

3 inventors:

Paul L Pfaff (16 out of 19 patents)

Michael Mauck (1 out of 7 patents)

Kevin L Russell (1 out of 7 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Attofemto, Inc.. Retrieved from https://idiyas.com/company/attofemto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]