Location History:
- Menlo Park, CA (US) (1993)
- San Francisco, CA (US) (1999 - 2015)
Company Filing History:
3 out of 13,713 
1 out of 3,549 
1 out of 1,787 
Years Active: 1993-2015
Title: Paul Arleo: Innovator in Process Condition Measurement
Introduction
Paul Arleo is a notable inventor based in San Francisco, CA, with a focus on advancements in process condition measurement technology. He holds a total of 5 patents, showcasing his contributions to the field of workpiece processing tools.
Latest Patents
Among his latest innovations is the Process Condition Measuring Device (PCMD), which is designed to measure process conditions in workpiece processing tools. This device features first and second substrate components, each embedded with temperature sensors. The alignment of these sensors allows for accurate measurement of temperature differences, which can be used to calculate process conditions in the tool. Another significant patent involves an electrostatic or mechanical chuck assembly that improves temperature uniformity for workpieces. This assembly utilizes gas inlets strategically placed to enhance cooling efficiency through thermal conduction and gas diffusion.
Career Highlights
Throughout his career, Paul has worked with prominent companies such as Applied Materials, Inc. and Cypress Semiconductor Corporation. His experience in these organizations has contributed to his expertise in the field of semiconductor technology and process measurement.
Collaborations
Paul has collaborated with notable professionals in the industry, including Jon Henri and Graham W. Hills. These partnerships have likely enriched his work and led to further innovations in process condition measurement.
Conclusion
Paul Arleo's contributions to the field of process condition measurement reflect his dedication to innovation and technology. His patents and career achievements highlight his role as a significant inventor in the industry.