Patrick Stamp

Title: The Innovative Contributions of Patrick Stamp

Introduction

Patrick Stamp is a notable inventor based in Carouge, Switzerland. He has made significant contributions to the field of optical technology, particularly in the measurement of refractive indices. With a total of 3 patents to his name, Stamp's work has advanced the understanding and application of optical waveguides.

Latest Patents

One of Patrick Stamp's latest patents is an apparatus for measuring the cross-sectional distribution of refractive index. This invention features an optical waveguide portion on a substrate, where a luminous flux for measurement is directed onto one end face of the optical waveguide substrate. The apparatus captures only the leaking light that has passed through the substrate, allowing for precise measurement of the refractive index distribution based on changes in the received light quantity. Another similar patent also focuses on measuring the cross-sectional distribution of refractive index, utilizing a projection system and a light receiving unit to enhance measurement accuracy.

Career Highlights

Patrick Stamp is currently associated with Kabushiki Kaisha Topcon, a company known for its innovations in optical and measurement technologies. His work at Topcon has allowed him to develop cutting-edge solutions that address complex challenges in the field.

Collaborations

Throughout his career, Patrick Stamp has collaborated with esteemed colleagues such as Nicolas Gisin and Nobuo Hori. These partnerships have fostered a rich exchange of ideas and have contributed to the advancement of optical measurement technologies.

Conclusion

Patrick Stamp's innovative work in optical technology and his contributions to the measurement of refractive indices highlight his importance in the field. His patents and collaborations reflect a commitment to advancing scientific knowledge and practical applications in optics.