The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 1994
Filed:
Apr. 07, 1992
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
According to the present invention, there are provided a projection system having an optical axis inclined toward one end surface of an optical waveguide portion arranged on one side of a substrate portion and for irradiating luminous flux for measurement from one end surface of the optical waveguide portion, and a light receiving unit for receiving luminous flux leaking from the optical waveguide portion among the luminous fluxes for measurement, projected light is effectively utilized for measurement, whereby cross-sectional distribution of refractive index of the optical waveguide is measured by change of light quantity entering said light receiving unit in case an incident point of the luminous flux is moved.