Kabushiki Kaisha Topcon

Patrick Stamp

Nobuo Hori

Nicolas Gisin

Shigenori Nagano

Rogerio Passy

An optical waveguide portion is provided on one surface of a substrate portion. A luminous flux for measurement is caused to be incident on one end face of the optical waveguide substrate, and only leaking light having passed through the substrate portion is received. The cross-sectional distribution of the refractive index of the optical waveguide portion is measured from changes in the received quantity of light.

Apparatus for measuring cross-sectional distribution of refractive index

According to the present invention, there are provided a projection system for emitting luminous flux for measurement, a light receiving unit or a prism member furnished with a light receiving unit, and an optical waveguide substrate comprising a substrate portion and an optical waveguide portion formed on the substrate portion, the light receiving unit or the prism is brought into close contact with the optical waveguide substrate, luminous flux for measurement from the projection system is passed from one end of the optical wavegide portion and a part of the luminous flux for measurement is leaked toward the light receiving unit, whereby cross-sectional distribution of refractive index of the optical waveguide is measured by change of light quantity of the leaking light sensed at the light receiving unit in case an incident point of the luminous flux for measurement is moved.

According to the present invention, there are provided a projection system having an optical axis inclined toward one end surface of an optical waveguide portion arranged on one side of a substrate portion and for irradiating luminous flux for measurement from one end surface of the optical waveguide portion, and a light receiving unit for receiving luminous flux leaking from the optical waveguide portion among the luminous fluxes for measurement, projected light is effectively utilized for measurement, whereby cross-sectional distribution of refractive index of the optical waveguide is measured by change of light quantity entering said light receiving unit in case an incident point of the luminous flux is moved.

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Carouge, Switzerland

Patrick Stamp