This inventor holds 3 USPTO granted patents and 4 published patent applications. Top assignee: Exactus, Inc.. Active years: 2003-2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003-2005
Title: Innovations of Patrick J Nystrom
Introduction
Patrick J Nystrom is a notable inventor based in Gresham, OR (US). He has made significant contributions to the field of radiometric temperature measurement systems. With a total of 3 patents to his name, Nystrom's work has advanced the technology used in semiconductor wafer processing.
Latest Patents
Nystrom's latest patents include a radiometric temperature measurement system that has reduced optical losses and improved wavelength selectivity. This system is capable of achieving wafer temperature measurements ranging from about 10°C to 4,000°C. It utilizes a YAG rod collection optic that directly couples specimen radiation to a filter and photo detector. The filter is designed to determine which radiation wavelengths are measured and may include a hot/cold mirror surface to reflect undesired wavelengths back to the specimen. The detector is formed from doped GaAlAs, which has a peaked response near 900 nm. A signal processor converts the signal into a temperature reading.
Another significant patent is a method of optical pyrometry that operates independently of emissivity and radiation transmission losses. This radiometric detector also features reduced optical losses and improved signal processing methods. It achieves temperature measurements of an object from about 10°C to 4,000°C. In this method, at least two detectors are employed, each detecting a different wavelength range. A dual-wavelength temperature measurement computation is utilized, which is independent of radiation transmission losses and the emissivity of the object being measured.
Career Highlights
Nystrom is currently employed at Exactus, Inc., where he continues to innovate in the field of temperature measurement technologies. His work has been instrumental in enhancing the accuracy and efficiency of temperature measurements in various applications.
Collaborations
One of his notable coworkers is Ronald A Palfenier, with whom he has collaborated on various projects.
Conclusion
Patrick J Nystrom's contributions to the field of radiometric temperature measurement systems have significantly advanced the technology used in semiconductor processing. His innovative patents reflect his expertise and commitment to improving measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile