The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Nov. 02, 2001
Applicant:
Inventors:

Ronald A. Palfenier, Oregon City, OR (US);

Patrick J. Nystrom, Gresham, OR (US);

Assignee:

Exactus, Inc., Boca Raton, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/130 ; G06F 1/500 ;
U.S. Cl.
CPC ...
G01K 1/130 ; G06F 1/500 ;
Abstract

A radiometric detector ( ) has reduced optical losses, improved wavelength selectivity, improved signal to noise, and improved signal processing methods to achieve temperature measurements of an object ( ) from about 10° C. to 4,000° C. A YAG rod collection optic ( ) directly couples object radiation ( ) to a filter ( ) and photo detector ( ). The filter determines which radiation wavelength range is measured, and optionally includes a hot/cold mirror surface ( ) for reflecting undesired radiation wavelengths back to the specimen. In a preferred measurement method, at least two detectors are employed, each detecting a different wavelength range. A dual-wavelength temperature measurement computation is employed that is independent of radiation transmission losses and the emissivity of the object being measured.


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