Patrick Blanckaert

Title: Patrick Blanckaert: Innovator in Optical Scanning Technology

Introduction

Patrick Blanckaert is a notable inventor based in Boortmeerbeek, Belgium. He has made significant contributions to the field of optical scanning technology, holding a total of 2 patents. His work focuses on innovative methods for dimensional acquisition of objects using advanced imaging techniques.

Latest Patents

Blanckaert's latest patents include an optical scanning probe designed for the dimensional acquisition of an object. This invention involves a scanning probe that irradiates the object with light and detects the reflected light. The probe consists of a detection unit with an imaging sensor and a sensor lens assembly, a light projecting unit with a light source and source optics, and an adjustment mechanism for optimizing the light plane's position relative to the detection unit. Additionally, he has developed a measuring apparatus that includes an imaging optical system configured to form an image of the object to be measured. This system features a transmissive member arranged near the image plane, which is inclined with respect to the optical axis, enhancing the precision of measurements.

Career Highlights

Throughout his career, Patrick Blanckaert has worked with prominent companies in the field of metrology and imaging technology. He has been associated with Nikon Metrology and Nikon Corporation, where he contributed to the development of cutting-edge optical technologies.

Collaborations

Blanckaert has collaborated with notable professionals in his field, including Frank Thys and Raf Nysen. These collaborations have further enriched his work and contributed to advancements in optical scanning technology.

Conclusion

Patrick Blanckaert's innovative contributions to optical scanning technology and his collaborations with industry professionals highlight his significant role in advancing this field. His patents reflect a commitment to enhancing measurement precision and imaging capabilities.