Yorktown Heights, NY, United States of America

Oliver C Wells


Average Co-Inventor Count = 1.7

ph-index = 6

Forward Citations = 223(Granted Patents)


Company Filing History:


Years Active: 1986-2010

where 'Filed Patents' based on already Granted Patents

9 patents (USPTO):

Title: The Innovations of Oliver C Wells

Introduction

Oliver C Wells is a prominent inventor based in Yorktown Heights, NY. He has made significant contributions to the field of electron microscopy, holding a total of 9 patents. His work has advanced the capabilities of scanning electron microscopes, making them more efficient and effective for various applications.

Latest Patents

Among his latest patents is a "Method for SEM measurement of features using magnetically filtered low loss electron microscopy." This invention involves a magnetically focused scanning charged particle microscope equipped with an array detector that detects scattered particles, ensuring that the particles fall substantially non-tangentially to the surface of the array detector. Another notable patent is the "Method of forming images in a scanning electron microscope," which utilizes an imaging device with multiple detector elements to construct various images of a specimen's surface during a single scan in the SEM.

Career Highlights

Oliver C Wells is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to technology and innovation.

Collaborations

Some of his notable coworkers include Lynne Marie Gignac and Rodney T Hodgson. Their collaborative efforts have played a crucial role in advancing the research and development of electron microscopy technologies.

Conclusion

Oliver C Wells is a distinguished inventor whose work in electron microscopy has led to significant advancements in the field. His innovative patents and collaborations with esteemed colleagues continue to shape the future of technology.

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