logo

For the Inventor, By the Inventor

Kawasaki, Japan

Nobumi Kodama

This inventor holds 10 USPTO granted patents. Top assignee: Fujitsu Corporation. Active years: 1987-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobumi Kodama. Retrieved from https://idiyas.com/inventor/nobumi-kodama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10

% Patents Active = 80.0

Average Co-Inventor Count = 5.0

ph-index = 6

Forward Citations = 98(Granted Patents)


Company Filing History:

goldMedal10 out of 39,371 
 
Fujitsu Corporation
 patents

Years Active: 1987-2007

Loading Chart...
10 patents (USPTO):Explore Patents
1. 7200059 - Semiconductor memory and burn-in test method of semiconductor memory (2007-04-03),
2. 7107504 - Test apparatus for semiconductor device (2006-09-12),
3. 4896302 - Semiconductor memory device having common driver circuits for plural (1990-01-23),
4. 4807193 - Semiconductor memory device with a detection circuit to detect word line (1989-02-21),
5. 4787067 - Semiconductor dynamic memory device having improved refreshing (1988-11-22),
6. 4771407 - Semiconductor integrated circuit having function for switching (1988-09-13),
7. 4742486 - Semiconductor integrated circuit having function for switching (1988-05-03),
8. 4740926 - Semiconductor memory device (1988-04-26),
9. 4716549 - Semiconductor memory device having a circuit for compensating for (1987-12-29),
10. 4704706 - Booster circuit (1987-11-03),

Title: Innovations of Nobumi Kodama in Semiconductor Technology

Introduction

Nobumi Kodama is a prominent inventor based in Kawasaki, Japan, known for his significant contributions to semiconductor technology. With a total of 10 patents to his name, he has made remarkable advancements in the field, particularly in memory devices.

Latest Patents

Kodama's latest patents include a semiconductor memory and a burn-in test method for semiconductor memory. This innovative burn-in test involves a series of steps where voltages are applied uniformly across bit lines with different structures. By ensuring that stress is applied equally, the characteristics of memory cells are preserved, preventing excessive deterioration during testing. Additionally, the test apparatus for semiconductor devices enhances the reliability of operational tests using Built Out Self Test (BOST) and Built In Self Test (BIST) methodologies. This apparatus includes an external test unit and improves the efficiency of testing by storing pattern data for various dependency tests.

Career Highlights

Kodama is currently employed at Fujitsu Corporation, where he continues to push the boundaries of semiconductor technology. His work has not only contributed to the advancement of memory devices but has also played a crucial role in improving testing methodologies.

Collaborations

Throughout his career, Kodama has collaborated with notable colleagues, including Yoshihiro Takemae and Kimiaki Sato, who is a talented woman in the field. These collaborations have fostered an environment of innovation and creativity, leading to groundbreaking advancements in semiconductor technology.

Conclusion

Nobumi Kodama's contributions to semiconductor technology through his patents and collaborations highlight his role as a leading inventor in the industry. His work continues to influence the development of more efficient and reliable semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…