The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Feb. 13, 2002
Masahiro Sato, Kawasaki, JP;
Junji Akaza, Kawasaki, JP;
Nobumi Kodama, Kawasaki, JP;
Hirohisa Mizuno, Kawasaki, JP;
Takashi Imura, Kawasaki, JP;
Yasurou Matsuzaki, Kawasaki, JP;
Masahiro Sato, Kawasaki, JP;
Junji Akaza, Kawasaki, JP;
Nobumi Kodama, Kawasaki, JP;
Hirohisa Mizuno, Kawasaki, JP;
Takashi Imura, Kawasaki, JP;
Yasurou Matsuzaki, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A test apparatus for a semiconductor device, which improves the reliability of an operational test on target devices on a wafer using BOST (Built Out Self Test) and BIST (Built In Self Test). The test apparatus includes an external test unit, the BIST circuit formed in the semiconductor device, and BOST device which is coupled between the external test unit and the semiconductor device. Pattern data for a pattern dependency test is stored in the BIST circuit and pattern data for a timing dependency test is stored in the BOST device.