Kawasaki, Japan

Hirohisa Mizuno


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Hirohisa Mizuno: Innovator in Semiconductor Testing Technology

Introduction

Hirohisa Mizuno is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of testing apparatuses. His innovative work has led to advancements that enhance the reliability of operational tests on semiconductor devices.

Latest Patents

Hirohisa Mizuno holds a patent for a "Test apparatus for semiconductor device." This invention improves the reliability of operational tests on target devices on a wafer by utilizing Built Out Self Test (BOST) and Built In Self Test (BIST) methodologies. The test apparatus comprises an external test unit, a BIST circuit formed within the semiconductor device, and a BOST device that connects the external test unit to the semiconductor device. The BIST circuit stores pattern data for a pattern dependency test, while the BOST device stores pattern data for a timing dependency test. This innovative approach significantly enhances the testing process for semiconductor devices.

Career Highlights

Hirohisa Mizuno is associated with Fujitsu Corporation, a leading company in the technology sector. His work at Fujitsu has allowed him to focus on developing advanced testing solutions for semiconductor devices. His contributions have been instrumental in improving the efficiency and reliability of semiconductor testing.

Collaborations

Hirohisa has collaborated with notable colleagues, including Masahiro Sato and Junji Akaza. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies in the semiconductor field.

Conclusion

Hirohisa Mizuno's contributions to semiconductor testing technology exemplify the importance of innovation in the tech industry. His patent for a test apparatus demonstrates his commitment to enhancing the reliability of semiconductor devices. His work continues to influence the field and pave the way for future advancements.

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