Tokyo, Japan

Noboru Okino

This inventor holds 5 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1992-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noboru Okino. Retrieved from https://idiyas.com/inventor/noboru-okino

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 80.0

Average Co-Inventor Count = 1.8

ph-index = 3

Forward Citations = 65(Granted Patents)


Location History:

  • Gyoda, JP (1992 - 1995)
  • Tokyo, JP (2004 - 2005)
  • Saitama, JP (2012)

Company Filing History:


Years Active: 1992-2012

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5 patents (USPTO):Explore Patents

Title: Noboru Okino: Innovator in Testing Technologies

Introduction

Noboru Okino is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of testing technologies, holding a total of 5 patents. His work focuses on developing advanced testing apparatuses and methods that enhance the efficiency and accuracy of memory testing.

Latest Patents

One of Noboru Okino's latest patents is a testing apparatus designed to streamline the testing process for wafers. This apparatus includes multiple test units, a shared storage for wafers, and a transport mechanism that facilitates the movement of wafers between the storage and test units. Additionally, it features a mainframe that specifies test procedures, a shared power source, and a pressure source that supplies necessary pressure to the test units. Each test unit is equipped with a test module that communicates with circuits on the wafer, ensuring thorough testing within a secure housing.

Another notable patent is a memory testing method and apparatus that significantly reduces the time required to test flash memory. This method involves writing a predetermined logical value to memory cells, reading the value, and comparing it to an expected value. If discrepancies arise, the method identifies failure memory cells and determines whether blocks or address lines are defective, allowing for efficient testing and management of memory resources.

Career Highlights

Noboru Okino is currently employed at Adv Antest Corporation, where he continues to innovate in the field of testing technologies. His expertise and inventions have positioned him as a key figure in the industry, contributing to advancements that benefit various sectors reliant on memory and wafer testing.

Collaborations

Noboru collaborates with talented individuals such as Yasuhiro Kawata and Masumi Okino, who serve as a legal representative. Their combined efforts enhance the development and protection of innovative technologies.

Conclusion

Noboru Okino's contributions to testing technologies exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in memory testing, making him a valuable asset to Adv Antest Corporation and the broader technological community.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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