This inventor holds 4 USPTO granted patents. Top assignees: Tokyo Electron Limited, Seiwa Optical Co., Ltd.. Active years: 2018-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Yamanashi, JP (2019)
- Nirasaki, JP (2018 - 2022)
Company Filing History:

Years Active: 2018-2022
Title: Muneaki Tamura: Innovator in Probe Technology
Introduction
Muneaki Tamura is a notable inventor based in Nirasaki, Japan. He has made significant contributions to the field of probe technology, holding a total of 4 patents. His work focuses on enhancing the efficiency and accuracy of wafer inspection processes.
Latest Patents
One of his latest patents is a probe device and method of adjusting the same. This innovative probe device is designed for inspecting wafers and includes an upper camera in a wafer alignment unit, a lower camera in a stage, and a target member with a target mark. The control circuit of the device manages the operations of both cameras, allowing for the acquisition of images of the target mark. This technology calculates the correspondence between specific physical parameters and values represented in the captured images.
Another significant patent is a test device, test method, and memory medium. This device tests needle marks generated in electrodes when a probe needle contacts them. It features an imaging part with a binning function and a controller that performs both high-speed low-precision and low-speed high-precision test processes. This dual approach ensures accurate determination of the state of the needle mark based on imaging results.
Career Highlights
Muneaki Tamura has worked with prominent companies in the technology sector, including Tokyo Electron Limited and Seiwa Optical Co., Ltd. His experience in these organizations has contributed to his expertise in probe technology and innovation.
Collaborations
Throughout his career, Muneaki has collaborated with talented individuals such as Shinji Akaike and Kenta Saiki. These partnerships have fostered a creative environment that has led to advancements in his field.
Conclusion
Muneaki Tamura's contributions to probe technology and his innovative patents demonstrate his commitment to advancing the industry. His work continues to influence the efficiency of wafer inspection processes, showcasing the importance of innovation in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile