logo

For the Inventor, By the Inventor

Srinagar, India

Mudasir Shafat Kawoosa

This inventor holds 17 USPTO granted patents and 1 published patent application and 1 EPO patent, primarily in Integrated Circuit Testing. Top assignee: Texas Instruments Corporation. Active years: 2016-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mudasir Shafat Kawoosa. Retrieved from https://idiyas.com/inventor/mudasir-shafat-kawoosa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 17 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.3

ph-index = 3

Forward Citations = 22(Granted Patents)


Location History:

  • Karnataka, IN (2020)
  • Srinagar, IN (2016 - 2024)
  • Bengaluru, IN (2024)

Company Filing History:

goldMedal17 out of 29,922 
 
Texas Instruments Corporation
 patents

Years Active: 2016-2025

Loading Chart...
Loading Chart...
Areas of Expertise:
Scan Access
JTAG State Machine
Test Time Reduction
Data Packing
Scan Throughput
Dynamic Control
Integrated Circuits
Test Interfaces
Scan Testing
Data Transfer
Storage Elements
Control Signals
17 patents (USPTO):Explore Patents
1. 12298346 - Secured scan access for a device including a scan chain (2025-05-13),
2. 11927633 - Secured scan access for a device including a scan chain (2024-03-12),
3. 11899063 - Generating multiple pseudo static control signals using on-chip JTAG state machine (2024-02-13),
4. 11747399 - Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface (2023-09-05),
5. 11408936 - Generating multiple pseudo static control signals using on-chip JTAG state machine (2022-08-09),
6. 11402432 - Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface (2022-08-02),
7. 10877093 - Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs (2020-12-29),
8. 10852353 - Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface (2020-12-01),
9. 10746797 - Dynamically protective scan data control (2020-08-18),
10. 10739402 - Generating multiple pseudo static control signals using on-chip JTAG state machine (2020-08-11),
11. 10088525 - Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputs (2018-10-02),
12. 10060979 - Generating multiple pseudo static control signals using on-chip JTAG state machine (2018-08-28),
13. 9970987 - Method and apparatus for test time reduction using fractional data packing (2018-05-15),
14. 9772376 - Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pins (2017-09-26),
15. 9448284 - Method and apparatus for test time reduction using fractional data packing (2016-09-20),

Title: **Mudasir Shafat Kawoosa: A Pioneer in Innovation**

Introduction

Mudasir Shafat Kawoosa, based in Srinagar, India, is a prominent inventor renowned for his remarkable contributions to the field of innovative technology. With an impressive portfolio of 17 patents, Kawoosa has demonstrated a commitment to enhancing device security and functionality through his inventions.

Latest Patents

Among his latest patents is a groundbreaking innovation titled "Secured Scan Access for a Device Including a Scan Chain." This invention incorporates a device that features a scan chain comprised of numerous storage elements and an output buffer. The design notably includes a shadow shift register connected to the scan output of one of the storage elements. The innovation also incorporates a signature register and a comparator, where the first input receives the shadow shift register's value, and the second input takes the value of the signature register. The output buffer, controlled by the comparator's output, provides a high-impedance output whenever the values of the shadow shift register and the signature register differ. This invention showcases Kawoosa's drive to push the boundaries of technological security.

Career Highlights

Mudasir Shafat Kawoosa's career is highlighted by his role at Texas Instruments Corporation, where he has made significant strides in the development of advanced technological solutions. His contributions have not only enhanced product performance but have also influenced industry standards in device security.

Collaborations

Throughout his career, Kawoosa has collaborated with esteemed professionals such as Rajesh Kumar Mittal and Sreenath Narayanan Potty. These collaborations have played a critical role in driving successful innovations and fostering a culture of teamwork and creativity within the organization.

Conclusion

Mudasir Shafat Kawoosa's journey as an inventor in Srinagar epitomizes the spirit of innovation and dedication to advancing technology. With a strong portfolio of patents and significant contributions to the field, Kawoosa continues to inspire future generations of inventors and tech enthusiasts alike. His innovative solutions are paving the way for secure and efficient devices across various applications, marking him as a notable figure in the technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…