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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11402432 B1

PDFFull Text
Date of Patent:
Aug. 02, 2022

Filed:

Oct. 26, 2020

Scan test control decoder with storage elements for use within integrated circuit (ic) devices having limited test interface

Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Mudasir Shafat Kawoosa, Srinagar, IN;

Vishal Diwan, Bengaluru, IN;

Assignee:

TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);

Attorneys:

Ebby Abraham

Charles A. Brill

Frank D. Cimino

Primary Examiner:

John J Tabone, Jr

Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/3183 (2006.01); G01R 31/3185 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31713 (2013.01); G01R 31/31723 (2013.01); G01R 31/31727 (2013.01); G01R 31/318385 (2013.01); G01R 31/318547 (2013.01); G01R 31/318555 (2013.01);
Abstract

An integrated circuit (IC) includes logic components and a scan test circuit coupled to the logic components. The IC also includes a scan input pin coupled to the scan test circuit. The IC also includes a scan input/output pin coupled to the scan test circuit. The scan test circuit includes a decoder coupled to at least one of the scan input pin and the scan input/output pin. The decoder includes storage elements configured to store different scan control signals and to output at least one of the different scan control signals in response to a master control signal.

Find Patent Forward Citations

Quick Actions:

Kawoosa, Mudasir. (2022). Scan test control decoder with storage elements for use within integrated circuit (ic) devices having limited test interface (U.S. Patent No. 11402432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11402432

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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