The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Feb. 07, 2024
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Mudasir Kawoosa, Bangalore, IN;

Pervez Garg, Bangalore, IN;

Prateek Giri, Chandigarh, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/31713 (2013.01); G01R 31/31715 (2013.01); G01R 31/318541 (2013.01); G01R 31/318588 (2013.01);
Abstract

A device includes a scan chain including a plurality of storage elements and an output buffer; a shadow shift register having a shadow shift input coupled to a scan output of one of the storage elements of the scan chain; a signature register; and a comparator having a first input, a second input, and an output. The comparator first input is to receive a value of the shadow shift register, and the comparator second input is to receive a value of the signature register. The output buffer has a control input coupled to the comparator output, and the output buffer provides a high-impedance output responsive to the value of the shadow shift register being unequal to the value of the signature register.


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