The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Apr. 22, 2019
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Rubin Ajit Parekhji, Bangalore, IN;
Mudasir Shafat Kawoosa, Srinagar, IN;
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G06F 11/263 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31725 (2013.01); G01R 31/31727 (2013.01); G01R 31/31853 (2013.01); G01R 31/318536 (2013.01); G01R 31/318552 (2013.01); G01R 31/318555 (2013.01); G06F 11/263 (2013.01);
Abstract
A method of testing a device under test, the device under test comprising a scan chain having a number of storage elements. The method determines a representation of toggling events in a test sequence, where the test sequence is for testing the scan chain. The method also selectively times input of a bit sequence, corresponding to the test sequence, to a first storage element in the number of storage elements, and through the scan chain, in response to the determining step.