Miyuki Shimizu

Title: The Innovations of Miyuki Shimizu

Introduction

Miyuki Shimizu is a notable inventor based in Nishikanbara-gun, Japan. She has made significant contributions to the field of surface inspection technology, holding 2 patents that showcase her innovative spirit and technical expertise.

Latest Patents

Her latest patents include a "Surface Inspection Apparatus and Surface Inspection Method for Strained Silicon Wafer." This invention involves an image pickup device that photographs the surface of a strained silicon wafer from various rotation angles. The device operates under specific conditions to capture bright lines on the wafer's surface while illuminated by a light source. The result is a composite image generated from multiple surface images taken at different angles.

Another patent is the "Surface Inspection Apparatus and Surface Inspection Method," which inspects multiple surfaces formed in the peripheral edge of a plate-like object. This apparatus includes an image pickup mechanism that photographs the peripheral edge and an image processing device that processes the captured images. The optical system guides the images in one direction, allowing for efficient inspection of the surfaces.

Career Highlights

Miyuki Shimizu has worked with prominent companies such as Shibaura Mechatronics Corporation and Covalent Materials Corporation. Her experience in these organizations has contributed to her development as an inventor and her understanding of advanced technologies.

Collaborations

Some of her notable coworkers include Yoshinori Hayashi and Koji Izunome. Their collaboration has likely fostered an environment of innovation and creativity in their respective projects.

Conclusion

Miyuki Shimizu's contributions to surface inspection technology reflect her dedication to innovation and excellence. Her patents demonstrate her ability to solve complex problems in the field, making her a significant figure in the world of inventions.