The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2008
Filed:
May. 29, 2007
Yoshinori Hayashi, Kanagawa-ken, JP;
Hiroyuki Naraidate, Iwate-ken, JP;
Makoto Kyoya, Kanagawa-ken, JP;
Koji Izunome, Niigata-ken, JP;
Hiromi Nagahama, Niigata-ken, JP;
Miyuki Shimizu, Niigaa Prefecture, JP;
Kazuhiko Hamatani, Kanagawa-ken, JP;
Yoshinori Hayashi, Kanagawa-ken, JP;
Hiroyuki Naraidate, Iwate-ken, JP;
Makoto Kyoya, Kanagawa-ken, JP;
Koji Izunome, Niigata-ken, JP;
Hiromi Nagahama, Niigata-ken, JP;
Miyuki Shimizu, Niigaa Prefecture, JP;
Kazuhiko Hamatani, Kanagawa-ken, JP;
Shibaura Mechatronics Corporation, Kanagawa, JP;
Covalent Materials Corporation, Tokyo, JP;
Abstract
A surface inspection apparatus, for inspecting a plurality of surfaces formed in a peripheral edge portion of a plate-like object, includes a image pickup mechanism, which photographs the peripheral edge portion of the plate-like object having a plurality of surfaces, and an image processing device, which processes an image obtained by the photographing device. The image pickup mechanism includes an optical system which guides images of the plurality of surfaces of the plate-like object in one direction, and a camera unit having an image pickup surface, on which the images of the plurality of surfaces guided by the optical system in the one direction are formed.