Kanagawa, Japan

Makoto Kyoya

This inventor holds 1 USPTO granted patent. Top assignees: Covalent Materials Corporation, Shibaura Mechatronics Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Kyoya. Retrieved from https://idiyas.com/inventor/makoto-kyoya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Makoto Kyoya: Innovator in Surface Inspection Technology

Introduction

Makoto Kyoya is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of surface inspection technology. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of surface inspections.

Latest Patents

Kyoya holds a patent for a "Surface Inspection Apparatus and Surface Inspection Method." This invention is designed to inspect multiple surfaces formed in the peripheral edge portion of a plate-like object. The apparatus includes an image pickup mechanism that photographs the peripheral edge portion and an image processing device that processes the captured images. The optical system guides images of the surfaces in one direction, while the camera unit captures these images effectively.

Career Highlights

Throughout his career, Kyoya has worked with reputable companies, including Shibaura Mechatronics Corporation and Covalent Materials Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Kyoya has collaborated with talented individuals such as Koji Izunome and Hiroyuki Naraidate. These partnerships have fostered innovation and have been instrumental in the development of his patented technology.

Conclusion

Makoto Kyoya's contributions to surface inspection technology exemplify his dedication to innovation. His patent and career achievements highlight his role as a significant figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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