Mitsuyasu Ohta

This inventor holds 19 USPTO granted patents, primarily in Semiconductor Testing. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 1994-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mitsuyasu Ohta. Retrieved from https://idiyas.com/inventor/mitsuyasu-ohta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 19

% Patents Active = 57.9

Average Co-Inventor Count = 2.5

ph-index = 6

Forward Citations = 167(Granted Patents)

Location History:

Katano, JP (1996 - 2004)
Osaka, JP (1994 - 2008)

Company Filing History:

19 out of 27,375

Matsushita Electric Industrial Co., Ltd.

patents

Years Active: 1994-2008

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Areas of Expertise:

Semiconductor Wiring Substrate

Integrated Circuit Device

Testing Method

Quality Evaluation

Test Sequence Generation

Design for Testability

Delay Faults

Inspection Method

Database for Design

Fault Detection

Functional Block

19 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7348595 - Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device (2008-03-25),

2. 7302658 - Methods for evaluating quality of test sequences for delay faults and related technology (2007-11-27),

3. 7203913 - Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same (2007-04-10),

4. 7197725 - Semiconductor integrated circuit and testing method for the same (2007-03-27),

5. 7171600 - Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device (2007-01-30),

6. 7032196 - Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device (2006-04-18),

7. 6734549 - Semiconductor device having a device for testing the semiconductor (2004-05-11),

8. 6708301 - Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor (2004-03-16),

9. 6651206 - Method of design for testability, test sequence generation method and semiconductor integrated circuit (2003-11-18),

10. 6625784 - Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same (2003-09-23),

11. 6615389 - Database for designing integrated circuit device, and method for designing integrated circuit device (2003-09-02),

12. 6499125 - Method for inserting test circuit and method for converting test data (2002-12-24),

13. 6271677 - Semiconductor integrated circuit and method for testing the semiconductor integrated circuit (2001-08-07),

14. 6253343 - Method of design for testability test sequence generation method and semiconductor integrated circuit (2001-06-26),

15. 6119250 - Semiconductor integrated circuit (2000-09-12),

Title: Mitsuyasu Ohta: Pioneering Inventor from Osaka

Introduction: Mitsuyasu Ohta is a renowned inventor hailing from Osaka, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Mitsuyasu Ohta holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Mitsuyasu Ohta has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Mitsuyasu Ohta has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge-sharing.

Conclusion: Mitsuyasu Ohta's passion for innovation and his relentless drive to push the boundaries of what is possible make him a true pioneer in the world of inventions, with his work continuing to inspire future generations of inventors.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]