Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor

Abstract

A semiconductor integrated circuit ( ) includes first, second and second functional blocks ( and ). The first, second and second functional blocks ( and ) are coupled together via an inter-block signal line ( ). The first functional block ( ) includes: a logic circuit ( ); a test data output circuit ( ), which operates during testing and outputs a predetermined test data pattern; a testing standby circuit ( ), which is connected between a selector ( ) and an external bidirectional pin and makes the functional block enter a standby state during testing; a tristate buffer ( ) that is made to have a high impedance by the testing standby circuit ( ); and a decision result output circuit ( ), which receives the test data pattern from the second functional block, compares the received test data pattern to an expected value stored therein, and outputs a decision result to a decision result signal line ( ).