The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Jan. 28, 2004
Sadami Takeoka, Osaka, JP;
Mitsuyasu Ohta, Osaka, JP;
Sadami Takeoka, Osaka, JP;
Mitsuyasu Ohta, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
In evaluating of the quality of test sequences for delay faults, when all the delay faults are equally regarded, the process of detecting the delay faults deserving to be detected and those not so deserving to be detected cannot be reflected on the quality evaluation for the test sequences. To solve the problem, a 'design delay value' on a signal path, on which a corresponding delay fault is defined, is weighted. This invention thus provides 'methods of evaluating the quality of test sequences for delay faults' capable of evaluating the quality of the “delay fault test sequences” with more accuracy.