This inventor holds 2 USPTO granted patents. Top assignees: Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation. Active years: 2016-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 1,409 
1 out of 2,874 
Years Active: 2016-2021
Title: Mitsugu Yamashita: Innovator in Charged Particle Beam Technology
Introduction
Mitsugu Yamashita is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology, holding 2 patents that showcase his innovative approach to enhancing observation methods.
Latest Patents
Yamashita's latest patents include a "Charged Particle Beam Apparatus and Sample Observation Method Using Superimposed Comparison Image Display." This invention addresses the challenges faced by non-expert observers who need to maintain a changing field of view while using a charged particle beam apparatus. By overlapping a live image with a comparison image, the invention allows for real-time adjustments without requiring the observer to move their line of sight. The interface is designed to minimize stress, enabling users to easily display a superimposed image on their monitors.
Another significant patent is the "Charged Particle Beam Apparatus and Program." This invention improves the operability of adjustment sliders, allowing for both coarse and fine adjustments of set values. The design ensures that the first adjustment slider remains stationary while the second slider can be moved, facilitating accurate control during operation.
Career Highlights
Yamashita has worked with prominent companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His experience in these organizations has contributed to his expertise in developing advanced technologies in the field of charged particle beams.
Collaborations
Yamashita has collaborated with notable colleagues, including Tohru Ando and Yayoi Konishi. Their combined efforts have likely fostered innovation and advancements in their respective projects.
Conclusion
Mitsugu Yamashita's contributions to charged particle beam technology reflect his dedication to improving observation methods and operational efficiency. His patents demonstrate a commitment to innovation that benefits both experts and non-experts in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile