Beijing, China

Ming Ruan

This inventor holds 28 USPTO granted patents and 3 published patent applications, plus 1 CIPO patent and 20 EPO patents, primarily in Radiation Detection. Top assignees: Nuctech Company Limited, Tsinghua University, Nuctech Jiangsu Company Limited. Active years: 2009-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming Ruan. Retrieved from https://idiyas.com/inventor/ming-ruan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 28 

% Patents Active = 78.6

 

 

Average Co-Inventor Count = 6.2

ph-index = 5

Forward Citations = 82(Granted Patents)


Company Filing History:


Years Active: 2009-2025

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Areas of Expertise:
Radiation Detection
Human Body Security
X-Ray Imaging
Back Scattering
Radioactive Material
Safety Inspection
Detection Method
Scintillation Detector
Gamma Rays
Neutron Detection
Imaging Systems
Mobile Inspection
28 patents (USPTO):Explore Patents

Title: The Innovative Journey of Ming Ruan

Introduction: Ming Ruan, a visionary inventor hailing from Beijing, CN, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Ming Ruan's latest patents include a cutting-edge artificial intelligence algorithm for autonomous vehicles and a revolutionary medical device for non-invasive glucose monitoring.

Career Highlights: With over two decades of experience in the tech industry, Ming Ruan has held key positions in leading research institutions and multinational companies, driving forward the boundaries of innovation.

Collaborations: Ming Ruan has collaborated with top universities and research institutions worldwide, fostering a culture of creativity and excellence in the field of technology.

Conclusion: Ming Ruan's relentless pursuit of innovation and his passion for creating solutions that improve lives make him a true pioneer in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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