The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2017
Filed:
Jul. 02, 2015
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ziran Zhao, Beijing, CN;
Wanlong Wu, Beijing, CN;
Yingkang Jin, Beijing, CN;
Le Tang, Beijing, CN;
Ming Ruan, Beijing, CN;
Xiao Tang, Beijing, CN;
Guangwei Ding, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The present disclosure provides a mobile back scattering imaging security inspection apparatus, comprising: a back scattering scanner (), a detector (), a controller (), and a movable stage () configured to carry the back scattering scanner, the detector and the controller and being movable with respect to the object to be inspected; wherein the back scattering scanner is a distributed X-ray source comprising a plurality of target points (), each of which is able to emit the ray beam individually, and wherein the back scattering scanner, the detector and the controller perform an imaging security inspection operation on the object to be inspected during moving along with the movable stage with respect to the object.