The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Nov. 25, 2021
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhi Zeng, Beijing, CN;
Jianmin Li, Beijing, CN;
Ming Ruan, Beijing, CN;
Yanli Deng, Beijing, CN;
Guoping Zhu, Beijing, CN;
Junli Li, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
Embodiments of the present application provide a detection method. The detection method includes: acquiring information of at least two first positions through which a particle passes before penetrating an object under detection, and information of at least two second positions through which the particle passes after penetrating the object under detection, wherein the object under detection is a metal product; reconstructing, based on the information of the at least two first positions, a first track before the particle penetrates the object under detection; reconstructing, based on the information of the at least two second positions, a second track after the particle penetrates the object under detection; processing the first track and the second track to obtain feature information of the object under detection; and determining, according to the feature information and preset feature information of an object of a target type, a detection result of the object under detection.