The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Dec. 20, 2013
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Ziran Zhao, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Wanlong Wu, Beijing, CN;
Ming Ruan, Beijing, CN;
Yinong Liu, Beijing, CN;
Yingkang Jin, Beijing, CN;
Le Tang, Beijing, CN;
Yanjie Wen, Beijing, CN;
Xiuwei Chen, Beijing, CN;
Fuhua Ding, Beijing, CN;
Bin Sang, Beijing, CN;
Zongjun Shen, Beijing, CN;
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Abstract
A human body back-scattering inspection system is disclosed. The system comprises a flying-spot forming unit configured to output beams of X-rays, a plurality of discrete detectors which are arranged vertically along a human body to be inspected, and a controlling unit coupled to the flying-spot forming unit and the plurality of detectors, and configured to generate a control signal to control the flying-spot forming unit and the plurality of detectors to perform a partition synchronous scan on the human body to be inspected vertically. The present disclosure utilizes the geometry property of the human body back-scattering inspection system, and proposes a multiple-point synchronous scan mechanism which largely accelerates the inspection of human body.