Kaohsiung, Taiwan

Ming-Da Hsieh

This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignee: United Microelectronics Corp.. Active years: 2012-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming-Da Hsieh. Retrieved from https://idiyas.com/inventor/ming-da-hsieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.6

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2012-2014

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3 patents (USPTO):Explore Patents

Title: Ming-Da Hsieh: Innovator in Semiconductor Fabrication

Introduction

Ming-Da Hsieh is an inventor based in Kaohsiung City, Taiwan. He is known for his contributions to semiconductor fabrication techniques. Although he currently holds no granted patents, his work in the field is noteworthy.

Latest Patent Applications

Ming-Da Hsieh has submitted several patent applications that showcase his innovative methods. One of his latest applications is titled "METHOD FOR FORMING DAMASCENE TRENCH STRUCTURE AND APPLICATIONS THEREOF." This method involves fabricating a damascene trench structure by providing a semiconductor structure with an inner layer dielectric and a patterned hard mask. The process includes etching the patterned hard mask in an atmosphere primarily consisting of nitrogen and carbon-fluoride compositions.

Another significant application is "METHOD TO CONTROL CRITICAL DIMENSION." This method aims to control critical dimensions in semiconductor fabrication. It begins with a material layer and a composite patterned layer covering it. The composite patterned layer defines a first critical dimension, and an etching gas is used to etch the composite layer, resulting in a transferred pattern with a second critical dimension that is substantially smaller than the first.

Conclusion

Ming-Da Hsieh's innovative approaches in semiconductor fabrication highlight his potential impact on the industry. His latest patent applications reflect his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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