Tokyo, Japan

Michiro Chiba

This inventor holds 3 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2022-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michiro Chiba. Retrieved from https://idiyas.com/inventor/michiro-chiba

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022-2023

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3 patents (USPTO):Explore Patents

Title: Michiro Chiba: Innovator in Sensor Testing Technology

Introduction

Michiro Chiba is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of sensor testing technology. With a total of 3 patents to his name, Chiba continues to push the boundaries of innovation in this specialized area.

Latest Patents

Chiba's latest patents include a sensor test apparatus designed to efficiently test sensors. This apparatus features an application unit that includes a socket for electronic connection to the sensor, a pressure chamber that applies pressure, and a heat sink that applies thermal stress. Another notable patent is a versatile sensor test apparatus that includes a first application unit, a test unit, and a conveying robot for sensor handling. These inventions showcase his commitment to enhancing the efficiency and versatility of sensor testing.

Career Highlights

Chiba is currently employed at Adv Antest Corporation, where he applies his expertise in sensor technology. His work has been instrumental in developing advanced testing solutions that meet the demands of modern technology.

Collaborations

Chiba collaborates with talented coworkers such as Kazunari Suga and Daisuke Takano. Together, they contribute to innovative projects that advance the field of sensor testing.

Conclusion

Michiro Chiba is a key figure in the realm of sensor testing technology, with a focus on creating efficient and versatile testing apparatuses. His contributions continue to shape the future of sensor technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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