The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Sep. 19, 2019
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Kazunari Suga, Tokyo, JP;

Daisuke Takano, Tokyo, JP;

Satoshi Hanamura, Tokyo, JP;

Michiro Chiba, Tokyo, JP;

Hisao Nishizaki, Tokyo, JP;

Atsushi Hayakawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/07 (2006.01); G01D 5/14 (2006.01); G01R 33/31 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/077 (2013.01); G01D 5/145 (2013.01); G01R 33/31 (2013.01); G01R 33/095 (2013.01);
Abstract

A sensor test system having excellent throughput is provided. The sensor test systemincludes a test apparatus groupincluding a plurality of sensor test apparatusesA toD coupled to each other so that the sensorcan be transferred, and each of the sensor test apparatusesA toD includes an application unitincluding an application deviceincluding a socketto which the sensoris electrically connected, and a pressure chamberwhich applies a pressure to the sensor, a test unitwhich tests the sensorvia the socket, and a conveying robotwhich conveys the sensorinto and out of the application unit


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