The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2023

Filed:

Sep. 19, 2019
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Kazunari Suga, Tokyo, JP;

Daisuke Takano, Tokyo, JP;

Satoshi Hanamura, Tokyo, JP;

Michiro Chiba, Tokyo, JP;

Hisao Nishizaki, Tokyo, JP;

Atsushi Hayakawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); B25J 9/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01R 31/2829 (2013.01); B25J 9/0084 (2013.01);
Abstract

A sensor test apparatus capable of efficiently testing a sensor is provided. A sensor test apparatuswhich tests the pressure sensorincludes an application unitincluding an application deviceincluding a socketto which the sensoris electronically connected, a pressure chamberwhich applies pressure to the sensor, and a heat sinkwhich applies a thermal stress to the sensor, the test unitwhich tests the sensorvia the socket, and the conveying robotwhich conveys the sensorinto and out of the application unit


Find Patent Forward Citations

Suga, Kazunari. (2023). Sensor test apparatus (U.S. Patent No. 11693049). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11693049

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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