Company Filing History:
Years Active: 2021-2024
Title: Michal Firstenberg: Innovator in Detection Technologies
Introduction
Michal Firstenberg is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of detection technologies, particularly in the identification of foreign elements in various substances. With a total of 2 patents to his name, Firstenberg's work showcases his innovative approach to solving complex problems.
Latest Patents
Firstenberg's latest patents include a "System and method for detection and identification of foreign elements in a substance by X-ray or Gamma-ray detection and emission." This invention outlines a method for inspecting substances to detect predetermined foreign elements that may carry X-ray responding material compositions. The system analyzes X-ray response signals to identify the location of foreign elements within the substance.
Another significant patent is the "Method and a system for XRF marking and reading XRF marks of electronic systems." This patent describes a method for producing XRF readable marks using specific chemical element concentrations. The multilayer structure of the XRF readable mark is designed to emit a unique XRF signal when irradiated, allowing for effective identification and marking of electronic components.
Career Highlights
Firstenberg is currently associated with Security Matters Ltd., where he continues to develop innovative solutions in detection technologies. His work has positioned him as a key player in the industry, contributing to advancements that enhance safety and security measures.
Collaborations
Throughout his career, Firstenberg has collaborated with notable colleagues, including Mor Kaplinsky and Haggai Alon. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.
Conclusion
Michal Firstenberg's contributions to detection technologies through his patents and collaborations highlight his role as an influential inventor. His innovative methods for identifying foreign elements and creating XRF readable marks demonstrate his commitment to advancing technology in meaningful ways.