Security Matters Ltd.

Michal Firstenberg

Haggai Alon

Nadav Yoran

Mor Kaplinsky

Avital Trachtman

Yair Grof

Tzemah Kislev

Tehila Nahum

Yifat Bareket

Nataly Tal

Hagit Sade

Dana Gasper

Ron Dafni

Chen Nachmias

Nachum Holin

Dmitrijs Docenko

In one embodiment, a system and a method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a movement path, as the substance moves along the movement path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of the overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.

System and method for detection and identification of foreign elements in a substance by X-ray or Gamma-ray detection and emission

There are disclosed a method of producing an XRF readable mark, the XRF readable mark and a component comprising thereof. The method comprises providing an XRF marking composition with specific relative concentrations of one or more chemical elements and fabricating a multilayer structure of the XRF readable mark. The relative concentrations are selected such that in response to irradiation of the XRF marking composition by XRF exciting radiation, the XRF marking composition emits an XRF signal indicative of a predetermined XRF signature. Fabricating the multilayer structure comprises implementing an attenuation layer with at least one element exhibiting high absorbance for an XRF exciting radiation and/or an XRF background; and implementing a marking layer comprising said XRF marking composition.

Method and a system for XRF marking and reading XRF marks of electronic systems

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Rehovot, Israel

Michal Firstenberg