The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Oct. 18, 2019
Security Matters Ltd., D.N. Hevel Eilot, IL;
Yair Grof, Rehovot, IL;
Dmitrijs Docenko, Jerusalem, IL;
Mor Kaplinsky, Herzliya, IL;
Haggai Alon, Kibbutz Naan, IL;
Yifat Bareket, Reut, IL;
Michal Firstenberg, Rehovot, IL;
Avital Trachtman, Lod, IL;
Nachum Holin, Kibbutz Kfar-Aza, IL;
Nadav Yoran, Tel Aviv, IL;
Abstract
In one embodiment, a system and a method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a movement path, as the substance moves along the movement path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of the overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.