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For the Inventor, By the Inventor

San Jose, CA, United States of America

Michael S Bakeman

This inventor holds 16 USPTO granted patents. Top assignees: Kla Tencor Corporation, Kla Corporation. Active years: 2014-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael S Bakeman. Retrieved from https://idiyas.com/inventor/michael-s-bakeman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 16

% Patents Active = 100.0

Average Co-Inventor Count = 3.3

ph-index = 8

Forward Citations = 221(Granted Patents)


Location History:

  • Union City, CA (US) (2017 - 2018)
  • Fremont, CA (US) (2018 - 2019)
  • San Jose, CA (US) (2014 - 2022)

Company Filing History:

goldMedal15 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal1 out of 619 
 
Kla Corporation
 patents

Years Active: 2014-2022

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16 patents (USPTO):Explore Patents
1. 11428650 - Computationally efficient x-ray based overlay measurement (2022-08-30),
2. 10801975 - Metrology tool with combined X-ray and optical scatterometers (2020-10-13),
3. 10545104 - Computationally efficient X-ray based overlay measurement (2020-01-28),
4. 10324050 - Measurement system optimization for X-ray based metrology (2019-06-18),
5. 10013518 - Model building and analysis engine for combined X-ray and optical metrology (2018-07-03),
6. 10012606 - X-ray based metrology with primary and secondary illumination sources (2018-07-03),
7. 10006865 - Confined illumination for small spot size metrology (2018-06-26),
8. 9885962 - Methods and apparatus for measuring semiconductor device overlay using X-ray metrology (2018-02-06),
9. 9846132 - Small-angle scattering X-ray metrology systems and methods (2017-12-19),
10. 9826614 - Compac X-ray source for semiconductor metrology (2017-11-21),
11. 9778213 - Metrology tool with combined XRF and SAXS capabilities (2017-10-03),
12. 9719932 - Confined illumination for small spot size metrology (2017-08-01),
13. 9693439 - High brightness liquid droplet X-ray source for semiconductor metrology (2017-06-27),
14. 9535018 - Combined x-ray and optical metrology (2017-01-03),
15. 9494535 - Scatterometry-based imaging and critical dimension metrology (2016-11-15),

Title: The Inventor Michael S Bakeman

Introduction: Michael S Bakeman is a renowned inventor based in San Jose, California. He has made significant contributions to the field of technology through his innovative creations.

Latest Patents: Michael S Bakeman holds several patents in various technological domains, showcasing his versatility and expertise in inventing cutting-edge solutions.

Career Highlights: Throughout his career, Michael S Bakeman has been recognized for his groundbreaking inventions that have revolutionized the industry. His dedication to pushing the boundaries of technology has led to numerous successful ventures.

Collaborations: Michael S Bakeman has collaborated with leading tech companies and research institutions to bring his inventions to life. His ability to work in multidisciplinary teams has resulted in the development of groundbreaking technologies.

Conclusion: In conclusion, Michael S Bakeman's passion for innovation and his relentless pursuit of technological advancement have solidified his reputation as a pioneering inventor in the vibrant tech hub of San Jose, California.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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